Researchers today must measure material and device characteristics that involve very small currents and voltages. Examples include the measurement of resistance and I-V characteristics of nanowires, nanotubes, semiconductors, metals, superconductors, and
Resistivity and conductivity type are fundamental properties of semiconductors and are critical parameters in both materials research and wafer fabrication. A semiconductor’s resistivity depends primarily on the bulk doping, but can be modified through de
The microelectronics laboratory has been an integral part of the modern curriculum in engineering education for years so that undergraduate students can apply what they’ve learned of their device physics and VLSI courses. In this way, they can perform mea
Low voltage measurements are often associated with resistance measurements of highly conductive semiconductor materials and devices. These tests normally involve sourcing a known current, measuring the resulting voltage, and calculating the resistance usi
